Our work extends Juba’s formulation of learning abductive reasoning from examples, in which both the relative plausibility of various explanations, as well as which explanations are valid, are learned directly from data. We extend the formulation to consider partially observed examples, along with declarative background knowledge about the missing data. We show that it is possible to use implicitly learned rules together with the explicitly given declarative knowledge to support hypotheses in the course of abduction. We observe that when a small explanation exists, it is possible to obtain a much-improved guarantee in the challenging exception-tolerant setting.

Juba recently proposed a formulation of learning abductive reasoning from examples, in which both the relative plausibility of various explanations, as well as which explanations are valid, are learned directly from data. The main shortcoming of this formulation of the task is that it assumes access to full-information (i.e., fully specified) examples; relatedly, it offers no role for declarative background knowledge, as such knowledge is rendered redundant in the abduction task by complete information. In this work we extend the formulation to utilize such partially specified examples, along with declarative background knowledge about the missing data. We show that it is possible to use implicitly learned rules together with the explicitly given declarative knowledge to support hypotheses in the course of abduction. We also show how to use knowledge in the form of graphical causal models to refine the proposed hypotheses. Finally, we observe that when a small explanation exists, it is possible to obtain a much-improved guarantee in the challenging exception-tolerant setting. Such small, human-understandable explanations are of particular interest for potential applications of the task.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.

Mutual information (MI) based approaches are a popular feature selection paradigm. Although the stated goal of MI-based feature selection is to identify a subset of features that share the highest mutual information with the class variable, most current MI-based techniques are greedy methods that make use of low dimensional MI quantities. The reason for using low dimensional approximation has been mostly attributed to the difficulty associated with estimating the high dimensional MI from limited samples. In this paper, we argue a different viewpoint that, given a very large amount of data, the high dimensional MI objective is still problematic to be employed as a meaningful optimization criterion, due to its overfitting nature: the MI almost always increases as more features are added, thus leading to a trivial solution which includes all features. We propose a novel approach to the MI-based feature selection problem, in which the overfitting phenomenon is controlled rigourously by means of a statistical test. We develop local and global optimization algorithms for this new feature selection model, and demonstrate its effectiveness in the applications of explaining variables and objects.